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• W2022037733 abstract "The X-ray powder diffraction profiles of SiC were calculated on the basis of the matrix intensity equation method in order to investigate the stacking sequence in β-SiC powders. In the case of “reichweite” R = 4, where R represents the correlation distance over which the occurrence of a layer type affects the probability of occurrence of a given layer, the structural relationship of the stacking sequence among 2H, 3C, 4H, and 6H polytypes can be discussed. High-resolution solid-state nuclear magnetic resonance (NMR) spectroscopy has been used to obtain the information concerning the different kinds of sites in 2H, 3C, 4H, and 6H polytypes. This approach reveals that it is possible to determine the amounts of stacking faults and the kinds of stacking modes in SiC by comparing the calculated X-ray powder diffraction profiles and by the simulation of each deconvoluted signal in the NMR spectra. The calculated result indicates that all of the β-SiC samples used consist of mainly the 3C type and some amount of the 6H type stacking modes." @default.
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• W2022037733 date "1997-03-01" @default.
• W2022037733 modified "2023-09-26" @default.
• W2022037733 title "Prediction of Stacking Faults in β-Silicon Carbide: X-ray and NMR Studies" @default.
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• W2022037733 doi "https://doi.org/10.1021/cm960471d" @default.
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