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• W2022064370 abstract "Multiresolution analysis for problems involving random parameter fields is considered. The random field is discretized by a Karhunen-Loève expansion. The eigenfunctions involved in this representation are computed by a wavelet expansion. The wavelet expansion allows to control the spatial resolution of the problem. Fine and coarse scales are defined, and the fine scales are taken into account by projection operators. The influence of the truncation level for the wavelet expansion on the computed reliability is documented." @default.
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• W2022064370 date "2012-01-01" @default.
• W2022064370 modified "2023-09-27" @default.
• W2022064370 title "Multiresolution Analysis for Stochastic Finite Element Problems with Wavelet-Based Karhunen-Loève Expansion" @default.
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• W2022064370 doi "https://doi.org/10.1155/2012/215109" @default.
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