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• W2022200140 endingPage "602" @default.
• W2022200140 startingPage "583" @default.
• W2022200140 abstract "Most metals in commercial use are protected from reaction with an environment at ambient temperature by an oxide layer of ~5 nm in thickness. This layer may increase in thickness, by solid state diffusion, at high (>300°C) temperature or may dissolve and be replaced by soluble species by electrochemical reactions in aqueous environments. These are the twin processes of corrosion and the problem of preventing such destructive transformations had led to a longstanding interest by corrosion scientists in the thin film: and indeed in sub-monolayers. Prior to the introduction of the techniques of surface derived ion and electron spectroscopy the chemical analyses of films, which had known physical and electronic characteristics, were unavailable. This review attempts to specify the requirements of an analytical technique for thin films and examines the present role of XPS in this context. The areas covered will include elemental analysis, evaluation of valence state, non-destructive information, elemental distribution and finally the use of ion-etch depth profiling. Examples are drawn from corrosion problems in both aqueous and gaseous environments." @default.
• W2022200140 created "2016-06-24" @default.
• W2022200140 creator A5075879241 @default.
• W2022200140 date "1977-11-01" @default.
• W2022200140 modified "2023-10-16" @default.
• W2022200140 title "The use of X-ray photoelectron spectroscopy in corrosion science" @default.
• W2022200140 cites W1634571199 @default.
• W2022200140 cites W1969858936 @default.
• W2022200140 cites W1971888155 @default.
• W2022200140 cites W1973960735 @default.
• W2022200140 cites W1975207517 @default.
• W2022200140 cites W1975918523 @default.
• W2022200140 cites W1980566832 @default.
• W2022200140 cites W1982473162 @default.
• W2022200140 cites W1984237315 @default.
• W2022200140 cites W1985872889 @default.
• W2022200140 cites W1989355328 @default.
• W2022200140 cites W1990026109 @default.
• W2022200140 cites W1991676652 @default.
• W2022200140 cites W1995575370 @default.
• W2022200140 cites W2001084635 @default.
• W2022200140 cites W2001159253 @default.
• W2022200140 cites W2003085949 @default.
• W2022200140 cites W2003565148 @default.
• W2022200140 cites W2005871215 @default.
• W2022200140 cites W2007754874 @default.
• W2022200140 cites W2009242026 @default.
• W2022200140 cites W2012688604 @default.
• W2022200140 cites W2019722875 @default.
• W2022200140 cites W2027076286 @default.
• W2022200140 cites W2027777801 @default.
• W2022200140 cites W2028761421 @default.
• W2022200140 cites W2033796837 @default.
• W2022200140 cites W2034097976 @default.
• W2022200140 cites W2036094017 @default.
• W2022200140 cites W2037077548 @default.
• W2022200140 cites W2039869020 @default.
• W2022200140 cites W2041881489 @default.
• W2022200140 cites W2046190256 @default.
• W2022200140 cites W2047196294 @default.
• W2022200140 cites W2048938349 @default.
• W2022200140 cites W2051767244 @default.
• W2022200140 cites W2051931354 @default.
• W2022200140 cites W2058993033 @default.
• W2022200140 cites W2059790889 @default.
• W2022200140 cites W2062959197 @default.
• W2022200140 cites W2068057229 @default.
• W2022200140 cites W2068602449 @default.
• W2022200140 cites W2071801141 @default.
• W2022200140 cites W2076244783 @default.
• W2022200140 cites W2076495868 @default.
• W2022200140 cites W2079195107 @default.
• W2022200140 cites W2082315745 @default.
• W2022200140 cites W2083389996 @default.
• W2022200140 cites W2086998781 @default.
• W2022200140 cites W2088962699 @default.
• W2022200140 cites W2093402998 @default.
• W2022200140 cites W2109146772 @default.
• W2022200140 cites W2110400631 @default.
• W2022200140 cites W2136312103 @default.
• W2022200140 cites W2162501803 @default.
• W2022200140 cites W2083373543 @default.
• W2022200140 doi "https://doi.org/10.1016/0039-6028(77)90250-3" @default.
• W2022200140 hasPublicationYear "1977" @default.
• W2022200140 type Work @default.
• W2022200140 sameAs 2022200140 @default.
• W2022200140 citedByCount "57" @default.
• W2022200140 countsByYear W20222001402013 @default.
• W2022200140 countsByYear W20222001402014 @default.
• W2022200140 countsByYear W20222001402016 @default.
• W2022200140 countsByYear W20222001402017 @default.
• W2022200140 countsByYear W20222001402019 @default.
• W2022200140 countsByYear W20222001402020 @default.
• W2022200140 countsByYear W20222001402021 @default.
• W2022200140 countsByYear W20222001402023 @default.
• W2022200140 crossrefType "journal-article" @default.
• W2022200140 hasAuthorship W2022200140A5075879241 @default.
• W2022200140 hasConcept C102404424 @default.
• W2022200140 hasConcept C107872376 @default.
• W2022200140 hasConcept C113196181 @default.
• W2022200140 hasConcept C127413603 @default.
• W2022200140 hasConcept C147789679 @default.
• W2022200140 hasConcept C151730666 @default.
• W2022200140 hasConcept C168900304 @default.
• W2022200140 hasConcept C171250308 @default.
• W2022200140 hasConcept C175708663 @default.
• W2022200140 hasConcept C178790620 @default.
• W2022200140 hasConcept C184651966 @default.
• W2022200140 hasConcept C185592680 @default.
• W2022200140 hasConcept C19067145 @default.
• W2022200140 hasConcept C191897082 @default.
• W2022200140 hasConcept C192562407 @default.
• W2022200140 hasConcept C20625102 @default.
• W2022200140 hasConcept C2779343474 @default.
• W2022200140 hasConcept C2779851234 @default.
• W2022200140 hasConcept C42360764 @default.
• W2022200140 hasConcept C7070889 @default.
• W2022200140 hasConcept C86803240 @default.

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