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- W2022206104 abstract "Electrostatic discharge (ESD) protection requirements for high voltage (HV) MOS technology are continuously evolving and increasingly stringent. To address the ever changing technology ESD constraints, a method for design, characterization, and integration of reliable mixed-signal HV MOS ESD solutions is introduced in this study. The dynamic response, design trade-offs and ESD verification in two HV CMOS-based technologies are discussed and depicted via fast transient and quasi-static measurements in the ESD-time domain." @default.
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- W2022206104 date "2008-10-01" @default.
- W2022206104 modified "2023-09-22" @default.
- W2022206104 title "Electrostatic discharge protection framework for mixed-signal high voltage CMOS applications" @default.
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- W2022206104 doi "https://doi.org/10.1109/icsict.2008.4734538" @default.
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