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• W2022286402 abstract "Laplace transforms applicable to ARXPS measurements of an exponential decay composition–depth distribution function are derived. This function is fitted to experimental ARXPS data, acquired from a polystyrene sample just after oxygen/helium plasma treatment, using both Al and Mg radiation, and the results compared with the profiles obtained by fitting models constructed from linear segments. The effects of the elastic scattering of photoelectrons are taken into account and the resulting profiles compared with those obtained using inelastic mean free paths. The influence of elastic scattering on the results was judged to be minimal. The exponential decay composition depth profile model did not fit the data considered as well as models based upon linear concentration gradients." @default.
• W2022286402 created "2016-06-24" @default.
• W2022286402 creator A5073361581 @default.
• W2022286402 date "2004-04-01" @default.
• W2022286402 modified "2023-09-25" @default.
• W2022286402 title "An exponential decay function as a model of the oxygen concentration profile in the surface of a polystyrene sample exposed to an oxygen plasma" @default.
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• W2022286402 doi "https://doi.org/10.1016/j.elspec.2003.07.001" @default.
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