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- W2022302098 abstract "The analysis of ESD qualification fails for a large IC is presented. With a careful procedure all fails are explained. Several failures are related to stress accumulation. This is unlikely to occur in assembly lines. ESD qualification procedures should take this into account. This saves test, analysis and redesign costs." @default.
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- W2022302098 date "2012-10-18" @default.
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- W2022302098 title "Analysis of ESD fails in a 45 nm mixed signal SoC" @default.
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