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- W2022312316 abstract "This paper describes a yield learning infrastructure that has been developed and deployed to help rapidly ramp 65-nm random and systematic yield. This infrastructure consists of a 4-Mb addressable-array test circuit with >8000 unique test structures along with customized software and automated analysis routines to distill the large datasets generated. Examples of the successful application of this methodology are provided." @default.
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- W2022312316 date "2008-05-01" @default.
- W2022312316 modified "2023-10-03" @default.
- W2022312316 title "A 65-nm Random and Systematic Yield Ramp Infrastructure Utilizing a Specialized Addressable Array With Integrated Analysis Software" @default.
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- W2022312316 doi "https://doi.org/10.1109/tsm.2008.2000277" @default.
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