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- W2022854460 abstract "This paper proposes comprehensive fault models to accommodate the typical manufacturing defects in resonant tunneling diode (RTD) threshold logic integrated circuits. The defects, such as device (field-effect transistor or RTD) short or open, can be modeled as conditional stuck-at fault models. The errors due to the RTD size variations are abstracted as threshold-change fault models. A testing methodology based on the proposed fault models is presented." @default.
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- W2022854460 date "2006-01-01" @default.
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- W2022854460 title "Testing for Threshold Logic Circuits Based on Resonant Tunneling Diodes" @default.
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- W2022854460 doi "https://doi.org/10.1109/nano.2006.247658" @default.
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