FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2023142760> ?p ?o ?g. }

• W2023142760 abstract "In this paper a variability-aware compact modeling strategy is presented for 20-nm bulk planar technology, taking into account the critical dimension long-range process variation and local statistical variability. Process and device simulations and statistical simulations for a wide range of combinations of L and W are carefully carried out using a design of experiments approach. The variability aware compact model strategy features a comprehensively extracted nominal model and two groups of selected parameters for extractions of the long-range process variation and statistical variability. The unified variability compact modeling method can provide a simulation frame for variability aware technology circuit co-optimization." @default.
• W2023142760 created "2016-06-24" @default.
• W2023142760 creator A5006724349 @default.
• W2023142760 creator A5016091223 @default.
• W2023142760 creator A5022995546 @default.
• W2023142760 creator A5043471671 @default.
• W2023142760 creator A5051464758 @default.
• W2023142760 creator A5052787170 @default.
• W2023142760 creator A5055777862 @default.
• W2023142760 creator A5072886327 @default.
• W2023142760 creator A5074429729 @default.
• W2023142760 creator A5079337901 @default.
• W2023142760 date "2014-09-01" @default.
• W2023142760 modified "2023-09-27" @default.
• W2023142760 title "Variability-aware compact model strategy for 20-nm bulk MOSFETs" @default.
• W2023142760 cites W2048782890 @default.
• W2023142760 cites W2063006450 @default.
• W2023142760 cites W2067510907 @default.
• W2023142760 cites W2069325961 @default.
• W2023142760 cites W2071542943 @default.
• W2023142760 cites W2088584585 @default.
• W2023142760 cites W2114131053 @default.
• W2023142760 cites W2137891515 @default.
• W2023142760 cites W2138164565 @default.
• W2023142760 cites W2144042557 @default.
• W2023142760 doi "https://doi.org/10.1109/sispad.2014.6931621" @default.
• W2023142760 hasPublicationYear "2014" @default.
• W2023142760 type Work @default.
• W2023142760 sameAs 2023142760 @default.
• W2023142760 citedByCount "2" @default.
• W2023142760 countsByYear W20231427602014 @default.
• W2023142760 countsByYear W20231427602015 @default.
• W2023142760 crossrefType "proceedings-article" @default.
• W2023142760 hasAuthorship W2023142760A5006724349 @default.
• W2023142760 hasAuthorship W2023142760A5016091223 @default.
• W2023142760 hasAuthorship W2023142760A5022995546 @default.
• W2023142760 hasAuthorship W2023142760A5043471671 @default.
• W2023142760 hasAuthorship W2023142760A5051464758 @default.
• W2023142760 hasAuthorship W2023142760A5052787170 @default.
• W2023142760 hasAuthorship W2023142760A5055777862 @default.
• W2023142760 hasAuthorship W2023142760A5072886327 @default.
• W2023142760 hasAuthorship W2023142760A5074429729 @default.
• W2023142760 hasAuthorship W2023142760A5079337901 @default.
• W2023142760 hasBestOaLocation W20231427602 @default.
• W2023142760 hasConcept C111919701 @default.
• W2023142760 hasConcept C11413529 @default.
• W2023142760 hasConcept C114289077 @default.
• W2023142760 hasConcept C119599485 @default.
• W2023142760 hasConcept C121332964 @default.
• W2023142760 hasConcept C121684516 @default.
• W2023142760 hasConcept C126042441 @default.
• W2023142760 hasConcept C127413603 @default.
• W2023142760 hasConcept C134786449 @default.
• W2023142760 hasConcept C146978453 @default.
• W2023142760 hasConcept C154945302 @default.
• W2023142760 hasConcept C165801399 @default.
• W2023142760 hasConcept C172385210 @default.
• W2023142760 hasConcept C202444582 @default.
• W2023142760 hasConcept C204323151 @default.
• W2023142760 hasConcept C24326235 @default.
• W2023142760 hasConcept C2778334786 @default.
• W2023142760 hasConcept C2778413303 @default.
• W2023142760 hasConcept C33676613 @default.
• W2023142760 hasConcept C33923547 @default.
• W2023142760 hasConcept C41008148 @default.
• W2023142760 hasConcept C44870925 @default.
• W2023142760 hasConcept C76155785 @default.
• W2023142760 hasConcept C93389723 @default.
• W2023142760 hasConcept C98045186 @default.
• W2023142760 hasConceptScore W2023142760C111919701 @default.
• W2023142760 hasConceptScore W2023142760C11413529 @default.
• W2023142760 hasConceptScore W2023142760C114289077 @default.
• W2023142760 hasConceptScore W2023142760C119599485 @default.
• W2023142760 hasConceptScore W2023142760C121332964 @default.
• W2023142760 hasConceptScore W2023142760C121684516 @default.
• W2023142760 hasConceptScore W2023142760C126042441 @default.
• W2023142760 hasConceptScore W2023142760C127413603 @default.
• W2023142760 hasConceptScore W2023142760C134786449 @default.
• W2023142760 hasConceptScore W2023142760C146978453 @default.
• W2023142760 hasConceptScore W2023142760C154945302 @default.
• W2023142760 hasConceptScore W2023142760C165801399 @default.
• W2023142760 hasConceptScore W2023142760C172385210 @default.
• W2023142760 hasConceptScore W2023142760C202444582 @default.
• W2023142760 hasConceptScore W2023142760C204323151 @default.
• W2023142760 hasConceptScore W2023142760C24326235 @default.
• W2023142760 hasConceptScore W2023142760C2778334786 @default.
• W2023142760 hasConceptScore W2023142760C2778413303 @default.
• W2023142760 hasConceptScore W2023142760C33676613 @default.
• W2023142760 hasConceptScore W2023142760C33923547 @default.
• W2023142760 hasConceptScore W2023142760C41008148 @default.
• W2023142760 hasConceptScore W2023142760C44870925 @default.
• W2023142760 hasConceptScore W2023142760C76155785 @default.
• W2023142760 hasConceptScore W2023142760C93389723 @default.
• W2023142760 hasConceptScore W2023142760C98045186 @default.
• W2023142760 hasLocation W20231427601 @default.
• W2023142760 hasLocation W20231427602 @default.
• W2023142760 hasOpenAccess W2023142760 @default.
• W2023142760 hasPrimaryLocation W20231427601 @default.
• W2023142760 hasRelatedWork W1552177954 @default.
• W2023142760 hasRelatedWork W1597293305 @default.

• next