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• W2023155196 abstract "Excessive test power consumption and growing test data volume are both serious concerns for the semiconductor industry. Various low-power X-filling techniques and test data compression schemes were developed accordingly to address the above problems. These methods, however, often exploit the very same “don't-care” bits in the test cubes to achieve different objectives and hence may contradict each other. In this paper, we propose novel techniques to reduce scan capture power in linear decompressor-based test compression environment, by employing algorithmic solutions to fill and flip X-variables supplied to the linear decompressor. Experimental results on benchmark circuits demonstrate that our proposed techniques significantly outperform existing solutions." @default.
• W2023155196 created "2016-06-24" @default.
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• W2023155196 date "2012-11-01" @default.
• W2023155196 modified "2023-09-27" @default.
• W2023155196 title "On X-Variable Filling and Flipping for Capture-Power Reduction in Linear Decompressor-Based Test Compression Environment" @default.
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• W2023155196 doi "https://doi.org/10.1109/tcad.2012.2201481" @default.
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