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• W2023257966 abstract "Track damage and the associated ejection of atoms and molecules from insulators, which occur as a result of ion-induced electronic excitation, are of interest both in their own right and because of the mechanisms through which the energy in the excited electrons is transformed into atomic motion. In this paper an overview is given of the phenomena that are observed. We show that there is a remarkable similarity between the damage profile along the ion's track in the solid and the yield of ejected atoms at the energy that corresponds to each point on the track. It is also seen that the density of extended defects (or, correspondingly, the ejected particle yield) appears to have a “universal” form that is weakly dependent on the type of material. In the model presented this is a consequence of the inner-shell ionization of light elements in the solid by the incident ion; the resulting Auger decay produces an intense ionization spike that locally triggers the track formation/erosion process. This model allows the estimation of erosion yields/damage profiles for different ions and materials." @default.
• W2023257966 created "2016-06-24" @default.
• W2023257966 creator A5082512969 @default.
• W2023257966 date "1984-03-01" @default.
• W2023257966 modified "2023-09-28" @default.
• W2023257966 title "Track damage and erosion of insulators by ion-induced electronic processes" @default.
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• W2023257966 doi "https://doi.org/10.1016/0168-583x(84)90265-9" @default.
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