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- W2023276329 abstract "With the ever increasing complexity in IC design and with the introduction of flip chip technology, the pressing need for computer aided fault isolation (FI) is sensed. Fanin tree is a collection of subsequent fan-in signals with respect to a given node. As such, possible failing locations can be narrowed down to nodes that reside within the fanin tree only. Multiple fanin trees from multiple known failing nodes can also be intersected to locate common driving nodes. This paper presents an application program that was developed for Intel standard (.sch) netlist format. The result is FTREE; a fanin tree tool that is independent of product. This tool enhances the performance of other FA tools; but for its optimum usage, proper scan node selection is required during design stage. Selection of these nodes also is presented." @default.
- W2023276329 created "2016-06-24" @default.
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- W2023276329 date "1996-09-12" @default.
- W2023276329 modified "2023-09-27" @default.
- W2023276329 title "<title>Fault isolation with fanin tree technique</title>" @default.
- W2023276329 doi "https://doi.org/10.1117/12.250838" @default.
- W2023276329 hasPublicationYear "1996" @default.
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