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- W2023347218 abstract "This paper propounds an optoelectronic self-study inspection method for IC' shell blanks on the basis of comparison with standardized workpieces. First, the inspection system self- studies. Second, the system automatically inspects the products, and those exceeding the acceptance tolerance will be singled out as the unqualified. By comparing the inspected workpieces with the standard ones the system can identify defects such as shutdown and cutting-out. This method is of high inspection speed, powerful anti-interference ability, and high flexibility in term of shape variety.© (2000) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only." @default.
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- W2023347218 date "2000-10-10" @default.
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- W2023347218 title "<title>Optoelectronic inspection method for IC shell blanks</title>" @default.
- W2023347218 doi "https://doi.org/10.1117/12.403843" @default.
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