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• W2023347375 startingPage "1434" @default.
• W2023347375 abstract "We report the observation of strain-induced splitting of degenerate valence bands at the ensuremath{Gamma} point in coherently strained Ge(100) layers using angle-resolved photoemission spectroscopy. Strain was supplied via pseudomorphic epitaxial growth of Ge films on well-ordered InP(100) substrates: the inherent lattice mismatch between the two semiconductors resulted in a 3.9% tensile biaxial strain in the Ge epilayers. A surfactant layer was employed to increase the critical layer thickness and film quality so that measurements could be made on high-quality, fully strained films. A comparison is made between experimental results and the theoretical predictions of a heterojunction band-offset theory developed by Van de Walle and Martin which incorporates strain." @default.
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• W2023347375 date "1993-01-15" @default.
• W2023347375 modified "2023-09-26" @default.
• W2023347375 title "Observation of strain-induced splitting of degenerate valence bands using angle-resolved photoemission spectroscopy" @default.
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• W2023347375 doi "https://doi.org/10.1103/physrevb.47.1434" @default.
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