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- W2023378722 abstract "Abstract Estimates of the conduction electron mobility, lifetime and trap density of anodic bismuth oxide films, obtained by measuring the transient response of a polarized bismuth anode to an intense flash of white light, showed that the films had a highly defective structure. for thicker films (∼240 nm) the photo-response arose from the production of electron-hole pairs in the bulk of the film, but for very thin films (∼5 nm) the response arose from photo-emission of electrons from the metal into the film, and effects attributed to the decay of space charges of both electrons and mobile ions were observed. The photo-response was used to investigate the possible formation of films of bismuth oxo-halides under conditions in which these compounds were thermodynamically stable. Incorporation of iodide and bromide into the very thin films at pH 5 was detected. No effect of chloride was observed. Comparison with cyclic voltammetric results indicated that an anodic layer of bismuth oxoiodide might be formed by direct nucleation on to the metal surface." @default.
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- W2023378722 date "1979-11-01" @default.
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- W2023378722 title "Structure and electronic properties of bismuth anodic oxide films—I. Photoeffects" @default.
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- W2023378722 doi "https://doi.org/10.1016/0013-4686(79)87067-x" @default.
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