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- W2023483013 abstract "This paper presents a built-in SEU sensor (BISS) to detect soft errors in CMOS digital systems. BISS detects SEU-induced soft errors by monitoring the meta-stability in the flip-flops. BISS includes positive pulse generator, footed dynamic inverter and keeper. SPICE simulations validate the approach. Experiments show minor overhead in terms of area. BISS can yield 80% error coverage at the cost of 22% area overhead. As its prominent advantage, insertion of BISS will incur minimal performance degradation." @default.
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- W2023483013 date "2011-10-01" @default.
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- W2023483013 title "BISS: A Built-In SEU Sensor for Soft Error Mitigation" @default.
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- W2023483013 doi "https://doi.org/10.4028/www.scientific.net/amm.130-134.4228" @default.
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