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• W2023876865 abstract "The surface damage of Ni33Zr67 glass irradiated with 100 keV helium ions at room temperature has been investigated using scanning electron microscopy. The critical dose for blister formation was found to be 1 × 1018ions/cm2. Two generations of blisters and their exfoliations were observed. Alignment of first-generation exfoliated blister craters parallel to the ribbon length and rupture of second-generation blisters into a regular four-petalled configuration were rather striking observations. Flaking was observed only in the case of high dose-rate bombardment. The skin thicknesses of blisters in each of the two generations and that of the exfoliated layer in the case of flaking were nearly equal and compare well with the calculated mean projected range of helium ions in this alloy. Irradiation-induced partial crystallization of the Ni33Zr67 glass was observed by means of transmission electron microscopy but small helium bubbles could be resolved only at high ion fluences." @default.
• W2023876865 created "2016-06-24" @default.
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• W2023876865 date "1983-02-01" @default.
• W2023876865 modified "2023-09-25" @default.
• W2023876865 title "Effect of 100 keV helium ion bombardment on surface topography and microstructure of Ni33Zr67 glass" @default.
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• W2023876865 doi "https://doi.org/10.1016/0022-3115(83)90255-6" @default.
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