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- W2023953159 abstract "Abstract Al and Sn were deposited simultaneously by applying two W evaporation sources. The structural evolution of codeposited layers was studied on amorphous (amorphous C films and oxidized Si wafers) and single-crystal (air-cleaved NaCl and mica) substrates at a temperature of 200 C and at various oxygen partial pressures. The codeposition of Sn enhances the self-surface diffusion of Al as well as the liquid-like coalescence of Al crystals, and decreases the sensitivity of structure evolution againts O 2 Sn is segregated during the growth of Al crystals and forms three-dimensional particles. In O 2 atmosphere a solid phase layer develops on the surface of growing Al crystals and the deposition proceeds by the formation of a line-grained. “cermet” like structure." @default.
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- W2023953159 date "1993-04-01" @default.
- W2023953159 modified "2023-10-14" @default.
- W2023953159 title "Structural evolution in codeposited AlSn thin films" @default.
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- W2023953159 doi "https://doi.org/10.1016/0257-8972(93)90330-q" @default.
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