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• W2023994688 endingPage "497" @default.
• W2023994688 startingPage "479" @default.
• W2023994688 abstract "The roughness in GaN/InGaN thin films and multilayers was studied with Rutherford backscattering (RBS). Quantitative data analysis, including the determination of the roughness parameters, was made through the application of models developed for specific kinds of roughness and/or intermixing. In a first step, the assumptions made in the development of the models were tested, and their limits of validity were established. In all cases, the models are valid for relatively small aspect ratios of the interface or surface structures analysed, and the roughness parameters should follow a Gaussian distribution. Within their limits of application and validity, the models used in the RBS data analysis are general, and can be used in the study of any given system. The RBS results for GaN/InGaN thin films were compared to atomic force microscopy (AFM) and scanning electron microscopy experiments. In the samples within the application range of the models, excellent agreement was found between the roughness determined by RBS and the surface roughness measured with AFM for thin films. Finally, in GaN/InGaN multiple quantum wells, the roughness/intermixing was found to increase with both the well composition and the number of wells grown in the stack, due to a deterioration of the structural quality with the amount of strain incorporated in the structure." @default.
• W2023994688 created "2016-06-24" @default.
• W2023994688 creator A5010474532 @default.
• W2023994688 creator A5016039971 @default.
• W2023994688 creator A5018761725 @default.
• W2023994688 creator A5024359573 @default.
• W2023994688 creator A5027934170 @default.
• W2023994688 creator A5050137724 @default.
• W2023994688 creator A5058631175 @default.
• W2023994688 creator A5064034236 @default.
• W2023994688 creator A5066677047 @default.
• W2023994688 creator A5068793340 @default.
• W2023994688 creator A5075894620 @default.
• W2023994688 date "2004-05-01" @default.
• W2023994688 modified "2023-10-01" @default.
• W2023994688 title "Roughness in GaN/InGaN films and multilayers determined with Rutherford backscattering" @default.
• W2023994688 cites W1964891829 @default.
• W2023994688 cites W1966455327 @default.
• W2023994688 cites W1967810253 @default.
• W2023994688 cites W1968662698 @default.
• W2023994688 cites W1976161426 @default.
• W2023994688 cites W1980273331 @default.
• W2023994688 cites W1993107158 @default.
• W2023994688 cites W1994548926 @default.
• W2023994688 cites W2002069774 @default.
• W2023994688 cites W2005304717 @default.
• W2023994688 cites W2008632182 @default.
• W2023994688 cites W2017227099 @default.
• W2023994688 cites W2019376723 @default.
• W2023994688 cites W2028215583 @default.
• W2023994688 cites W2029017320 @default.
• W2023994688 cites W2035641663 @default.
• W2023994688 cites W2046164621 @default.
• W2023994688 cites W2056513663 @default.
• W2023994688 cites W2058279858 @default.
• W2023994688 cites W2058781659 @default.
• W2023994688 cites W2078009524 @default.
• W2023994688 cites W2078385737 @default.
• W2023994688 cites W2079228570 @default.
• W2023994688 cites W2081182564 @default.
• W2023994688 cites W2092225407 @default.
• W2023994688 cites W2113420097 @default.
• W2023994688 cites W2119441821 @default.
• W2023994688 cites W2169417688 @default.
• W2023994688 doi "https://doi.org/10.1016/j.nimb.2003.11.009" @default.
• W2023994688 hasPublicationYear "2004" @default.
• W2023994688 type Work @default.
• W2023994688 sameAs 2023994688 @default.
• W2023994688 citedByCount "31" @default.
• W2023994688 countsByYear W20239946882013 @default.
• W2023994688 countsByYear W20239946882014 @default.
• W2023994688 countsByYear W20239946882015 @default.
• W2023994688 countsByYear W20239946882016 @default.
• W2023994688 countsByYear W20239946882017 @default.
• W2023994688 countsByYear W20239946882022 @default.
• W2023994688 countsByYear W20239946882023 @default.
• W2023994688 crossrefType "journal-article" @default.
• W2023994688 hasAuthorship W2023994688A5010474532 @default.
• W2023994688 hasAuthorship W2023994688A5016039971 @default.
• W2023994688 hasAuthorship W2023994688A5018761725 @default.
• W2023994688 hasAuthorship W2023994688A5024359573 @default.
• W2023994688 hasAuthorship W2023994688A5027934170 @default.
• W2023994688 hasAuthorship W2023994688A5050137724 @default.
• W2023994688 hasAuthorship W2023994688A5058631175 @default.
• W2023994688 hasAuthorship W2023994688A5064034236 @default.
• W2023994688 hasAuthorship W2023994688A5066677047 @default.
• W2023994688 hasAuthorship W2023994688A5068793340 @default.
• W2023994688 hasAuthorship W2023994688A5075894620 @default.
• W2023994688 hasConcept C107365816 @default.
• W2023994688 hasConcept C113196181 @default.
• W2023994688 hasConcept C120665830 @default.
• W2023994688 hasConcept C121332964 @default.
• W2023994688 hasConcept C159985019 @default.
• W2023994688 hasConcept C171250308 @default.
• W2023994688 hasConcept C185592680 @default.
• W2023994688 hasConcept C19067145 @default.
• W2023994688 hasConcept C192562407 @default.
• W2023994688 hasConcept C199360897 @default.
• W2023994688 hasConcept C26771246 @default.
• W2023994688 hasConcept C2780547777 @default.
• W2023994688 hasConcept C41008148 @default.
• W2023994688 hasConcept C43617362 @default.
• W2023994688 hasConcept C71039073 @default.
• W2023994688 hasConcept C9395851 @default.
• W2023994688 hasConceptScore W2023994688C107365816 @default.
• W2023994688 hasConceptScore W2023994688C113196181 @default.
• W2023994688 hasConceptScore W2023994688C120665830 @default.
• W2023994688 hasConceptScore W2023994688C121332964 @default.
• W2023994688 hasConceptScore W2023994688C159985019 @default.
• W2023994688 hasConceptScore W2023994688C171250308 @default.
• W2023994688 hasConceptScore W2023994688C185592680 @default.
• W2023994688 hasConceptScore W2023994688C19067145 @default.
• W2023994688 hasConceptScore W2023994688C192562407 @default.
• W2023994688 hasConceptScore W2023994688C199360897 @default.
• W2023994688 hasConceptScore W2023994688C26771246 @default.
• W2023994688 hasConceptScore W2023994688C2780547777 @default.
• W2023994688 hasConceptScore W2023994688C41008148 @default.
• W2023994688 hasConceptScore W2023994688C43617362 @default.

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