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- W2024042308 abstract "Based on good electrostatic discharge (ESD) robustness, silicon-controlled rectifier (SCR) device is used for on-chip ESD protection. The major concern of SCR is the latch-up issue, because of its low holding voltage. Previous papers tried to design latchup-immune SCR devices; however, those devices would cause lower ESD robustness. In this letter, a new latchup-immune and robust SCR device for ESD protection is proposed and verified in a 0.25-μm 5-V CMOS process. Through inserting one additional parasitic bipolar junction transistor into SCR device structure, this new proposed SCR can increase the holding voltage without causing degradation on its ESD robustness." @default.
- W2024042308 created "2016-06-24" @default.
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- W2024042308 date "2013-05-01" @default.
- W2024042308 modified "2023-09-25" @default.
- W2024042308 title "A Latchup-Immune and Robust SCR Device for ESD Protection in 0.25-μm 5-V CMOS Process" @default.
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- W2024042308 doi "https://doi.org/10.1109/led.2013.2252456" @default.
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