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• W2024141060 abstract "A new plasma ion source for in situ keV He ion bombardment of solid state samples or thin films was designed and built for ion fluences between 1 × 1012 and 1 × 1017 ions/cm2. The system was designed to be mounted to different diffraction chambers for soft x-ray resonant magnetic scattering. Without breaking the vacuum due to He-ion bombardment, structural and magnetic modifications of the samples can be studied in situ and element specifically." @default.
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• W2024141060 date "2012-05-01" @default.
• W2024141060 modified "2023-10-07" @default.
• W2024141060 title "Plasma ion source for <i>in situ</i> ion bombardment in a soft x-ray magnetic scattering diffractometer" @default.
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• W2024141060 doi "https://doi.org/10.1063/1.4718937" @default.
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