Matches in SemOpenAlex for { <https://semopenalex.org/work/W2024281623> ?p ?o ?g. }
- W2024281623 endingPage "73" @default.
- W2024281623 startingPage "64" @default.
- W2024281623 abstract "We discuss how to self-consistently account for stoichiometry changes on surfaces with complex reconstructions, e.g. polar compound semiconductor surfaces. The key aspect of the methodology is that surface steps are allowed to act as a reservoir where atoms may be added or removed. The method is specifically applied to molecular beam epitaxy (MBE) and atomic layer epitaxy (ALE) results for GaAs(100) surfaces. The method easily demonstrates why only ∼ 12 monolayer (ML) of As is needed to convert from the Ga-rich surface to the (2 × 4) As-rich surface (as observed experimentally), even though the latter surface has an As coverage of 34 ML in the top layer. We also demonstrate how to convert from a more complex reconstruction, having two incomplete layers, to a simpler reconstruction having only one incomplete layer. The methodology also shows that ideal ALE of GaAs(100) cannot occur by cycling between the known adsorbate-free Ga-rich and As-rich surface reconstructions, because any such transition would not yield the observed 1 ML per cycle growth rate. We briefly discuss how adsorbates may stabilize ideally terminated (i.e. vacancy free) III–V surfaces. For example, methyl groups adsorbed on GaAs(100) exhibit a (1 × 2) LEED pattern, which is not seen for the clean GaAs(100) surface reconstructions. By using the electron counting model we interpret this structure as 12 ML CH3 adsorbed on a complete layer (1 ML) of dimerized Ga atoms. The ideal termination of the Ga-rich GaAs(100)-(1 × 2)-CH3 surface now allows for a plausible ALE mechanism which yields 1 ML deposition per cycle." @default.
- W2024281623 created "2016-06-24" @default.
- W2024281623 creator A5025025017 @default.
- W2024281623 date "1995-01-01" @default.
- W2024281623 modified "2023-09-24" @default.
- W2024281623 title "Accounting for stoichiometry changes on compound semiconductor surfaces" @default.
- W2024281623 cites W1967083888 @default.
- W2024281623 cites W1967674978 @default.
- W2024281623 cites W1968296297 @default.
- W2024281623 cites W1969843539 @default.
- W2024281623 cites W1973125711 @default.
- W2024281623 cites W1979292599 @default.
- W2024281623 cites W1979447262 @default.
- W2024281623 cites W1982042822 @default.
- W2024281623 cites W1984558013 @default.
- W2024281623 cites W1987478685 @default.
- W2024281623 cites W1989885272 @default.
- W2024281623 cites W1992842766 @default.
- W2024281623 cites W1996139191 @default.
- W2024281623 cites W1997818114 @default.
- W2024281623 cites W2000157257 @default.
- W2024281623 cites W2000674364 @default.
- W2024281623 cites W2007795764 @default.
- W2024281623 cites W2010750936 @default.
- W2024281623 cites W2031375804 @default.
- W2024281623 cites W2035490843 @default.
- W2024281623 cites W2037743515 @default.
- W2024281623 cites W2041084548 @default.
- W2024281623 cites W2042853877 @default.
- W2024281623 cites W2048389734 @default.
- W2024281623 cites W2052726420 @default.
- W2024281623 cites W2055315532 @default.
- W2024281623 cites W2056142303 @default.
- W2024281623 cites W2056411041 @default.
- W2024281623 cites W2057966851 @default.
- W2024281623 cites W2061158229 @default.
- W2024281623 cites W2071642821 @default.
- W2024281623 cites W2074370128 @default.
- W2024281623 cites W2077968522 @default.
- W2024281623 cites W2084346210 @default.
- W2024281623 cites W2086258835 @default.
- W2024281623 cites W2086898804 @default.
- W2024281623 cites W2087703929 @default.
- W2024281623 cites W2089500378 @default.
- W2024281623 cites W2091770127 @default.
- W2024281623 cites W2092909567 @default.
- W2024281623 cites W2118883607 @default.
- W2024281623 cites W2137828600 @default.
- W2024281623 cites W2140469579 @default.
- W2024281623 cites W2392717761 @default.
- W2024281623 cites W4319721064 @default.
- W2024281623 doi "https://doi.org/10.1016/0022-0248(94)00640-7" @default.
- W2024281623 hasPublicationYear "1995" @default.
- W2024281623 type Work @default.
- W2024281623 sameAs 2024281623 @default.
- W2024281623 citedByCount "6" @default.
- W2024281623 countsByYear W20242816232015 @default.
- W2024281623 crossrefType "journal-article" @default.
- W2024281623 hasAuthorship W2024281623A5025025017 @default.
- W2024281623 hasConcept C108225325 @default.
- W2024281623 hasConcept C110738630 @default.
- W2024281623 hasConcept C121955636 @default.
- W2024281623 hasConcept C144082473 @default.
- W2024281623 hasConcept C144133560 @default.
- W2024281623 hasConcept C147789679 @default.
- W2024281623 hasConcept C171250308 @default.
- W2024281623 hasConcept C185592680 @default.
- W2024281623 hasConcept C192562407 @default.
- W2024281623 hasConcept C2779227376 @default.
- W2024281623 hasConcept C2989315489 @default.
- W2024281623 hasConcept C49040817 @default.
- W2024281623 hasConcept C8010536 @default.
- W2024281623 hasConcept C86537342 @default.
- W2024281623 hasConceptScore W2024281623C108225325 @default.
- W2024281623 hasConceptScore W2024281623C110738630 @default.
- W2024281623 hasConceptScore W2024281623C121955636 @default.
- W2024281623 hasConceptScore W2024281623C144082473 @default.
- W2024281623 hasConceptScore W2024281623C144133560 @default.
- W2024281623 hasConceptScore W2024281623C147789679 @default.
- W2024281623 hasConceptScore W2024281623C171250308 @default.
- W2024281623 hasConceptScore W2024281623C185592680 @default.
- W2024281623 hasConceptScore W2024281623C192562407 @default.
- W2024281623 hasConceptScore W2024281623C2779227376 @default.
- W2024281623 hasConceptScore W2024281623C2989315489 @default.
- W2024281623 hasConceptScore W2024281623C49040817 @default.
- W2024281623 hasConceptScore W2024281623C8010536 @default.
- W2024281623 hasConceptScore W2024281623C86537342 @default.
- W2024281623 hasIssue "1-2" @default.
- W2024281623 hasLocation W20242816231 @default.
- W2024281623 hasOpenAccess W2024281623 @default.
- W2024281623 hasPrimaryLocation W20242816231 @default.
- W2024281623 hasRelatedWork W1546115925 @default.
- W2024281623 hasRelatedWork W1964541249 @default.
- W2024281623 hasRelatedWork W1991032759 @default.
- W2024281623 hasRelatedWork W2009655835 @default.
- W2024281623 hasRelatedWork W2024400607 @default.
- W2024281623 hasRelatedWork W2080401457 @default.
- W2024281623 hasRelatedWork W2152965073 @default.