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- W2024394994 abstract "We present first results obtained with pad detectors processed from 3 inch diameter GaAs wafers compensated with Cr. The detector characteristics are analyzed from the point of view of uniformity across the wafer." @default.
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- W2024394994 date "2004-09-01" @default.
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- W2024394994 title "GaAs detector material made from 3-inch wafers" @default.
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- W2024394994 doi "https://doi.org/10.1016/j.nima.2004.05.103" @default.
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