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• W2024403012 abstract "Abstract Time-of-flight experiments on amorphous semiconductors, in which carrier transport proceeds via multiple trapping in and release from a continuous distribution of localized states below a mobility edge, have been analysed using a new simulation technique. Several distributions are considered and the results compared with data on the temperature dependence of the electron drift mobility in a-Si:H. Conclusions are reached concerning the tail-state distribution and the magnitude of the extended-state mobility in this material." @default.
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• W2024403012 date "1985-09-01" @default.
• W2024403012 modified "2023-09-30" @default.
• W2024403012 title "Tail-state distribution and extended-state mobility in a-Si:H" @default.
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• W2024403012 doi "https://doi.org/10.1080/13642818508240599" @default.
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