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- W2024490096 abstract "Abstract The variation of the relative alloy sensitivity factor PPtCu used in the quantitative AES analysis of Pt-Cu alloys as a function of the atomic concentration of Pt was measured for in situ scraped sample surfaces. Through different Auger line combinations, i.e. Cu(105)-Pt(237), Cu(920)-Pt(237), and Cu(920)-Pt(1967), three sets of PPtCu were obtained. It was found that the as-measured PPtCu changes with composition in a complex manner. However, after background slope correction in the low energy range and noise correction in the high energy range, the variation of PPtCu of Cu(105)-Pt(237) and Cu(920)-Pt(237) become blurred while PPtCu of Cu(920)-Pt(1967) still decreases approximately 30% if the composition changes from 19 to 90 at% Pt. The variation of PPtCu of Cu(920)-Pt(1967) with composition is in agreement with that PPtCu should in principle not be constant with composition as it contains factors such as backscattering factor and escape depth, which are functions of composition. But the blurring of the variation of PPtCu of Cu(105)-Pt(237) and Cu(920)-Pt(237) with composition contradict this. If these variations also exist, the present results show that they may be too small to be detected with the present method. Though the change of PPtCu itself does not have a serious effect on the quantitative AES analysis, in view of the difficulty in accurate determination of the background slope and the noise corrections, the calibration curve method is suggested for accurate AES analysis, especially in dilute alloys." @default.
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- W2024490096 title "The relative alloy sensitivity factor of the Pt-Cu system" @default.
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- W2024490096 doi "https://doi.org/10.1016/0167-2584(89)91044-x" @default.
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