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• W2024494823 abstract "A frequency-domain electron beam induced current (EBIC) method for visualisation and analysis of noise-enhancement and/or instability regions related to generation–recombination effects in semiconductor devices is presented. The method is illustrated with examples. EBIC map of the InGaAsP/InP avalanche photodiode at the avalanche breakdown is compared with the EBIC map of current noise at the avalanche breakdown. Instability domains in Au/SI GaAs Schottky diode detector structures are visualised for the first time to our best knowledge." @default.
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• W2024494823 date "2002-04-01" @default.
• W2024494823 modified "2023-09-23" @default.
• W2024494823 title "Frequency-domain EBIC method for mapping of noise and instability regions in semiconductor devices" @default.
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• W2024494823 doi "https://doi.org/10.1016/s0921-5107(01)01019-4" @default.
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