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- W2024596181 abstract "Abstract In the study of charge injection in the insulator-silicon system, variation of the electric field in the insulator, caused by charge trapping during a measurement, makes the interpretation and analysis of experimental data difficult. A measuring system and test device structure are described in which it is possible to monitor any change of the device threshold voltage and to adjust the applied gate voltage so as to maintain a constant electric field at the insulator-silicon interface. Experimental results will be presented which show the advantages stemming from this mode of operation." @default.
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- W2024596181 date "1980-03-01" @default.
- W2024596181 modified "2023-10-02" @default.
- W2024596181 title "An experimental technique for the study of non-avalanche charge injection or trapping in MIS structures" @default.
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- W2024596181 doi "https://doi.org/10.1016/0038-1101(80)90007-6" @default.
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