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• W2024613700 abstract "We studied the effect of annealing temperature on the physical properties of WO 3 thin films using different experimental techniques. WO 3 has been prepared by hot-filament metal oxide deposition (HFMOD). The films, chemical stoichiometry was determined by X-ray photoelectron spectroscopy (XPS). The monoclinic single-phase nature of the as-deposited films, structure was changed to triclinic structure by annealing them at higher temperatures than 400°C, which has been determined by the X-ray diffraction analysis. By Raman scattering is confirmed the change of crystalline phase, of monoclinic to triclinic, since that lattice vibrational modes of as-deposited WO 3 and annealed at 500°C present clearly differences. WO 3 band gap energy can be varied from 2.92 to 3.15 eV by annealing WO 3 from 0 to 500°C as was obtained by transmittance measurements. The photoluminescence response of the as-deposited film presents three radiative transitions observed at 2.85, 2.41, and 2.04 eV that could be associated with oxygen vacancies; the first one is shifted to higher energies as the annealing temperature is increased due to the change of crystalline phase of the WO 3 ." @default.
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• W2024613700 date "2013-01-01" @default.
• W2024613700 modified "2023-10-18" @default.
• W2024613700 title "Characterization of WO₃Thin Films Grown on Silicon by HFMOD" @default.
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• W2024613700 doi "https://doi.org/10.1155/2013/591787" @default.
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