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• W2024723294 abstract "Through simulations and measurements, we show that in multi-slot thin film waveguides, the TM polarized modes can be confined mostly in the low refractive index layers of the waveguide. The structure consisted of alternating layers of a-Si and SiO(2), in the thickness range between 3 and 40 nm, for which the slots were the SiO(2) layers. Simulations were performed using the transfer matrix method and experiments using the m-line technique at 1.55 mum. The dependence of the birefringence and of the power confinement in the slots was studied as a function of the waveguide thickness, the Si and SiO(2) layer thicknesses, and the SiO(2) / Si layer thickness ratio. We find a large birefringence-a refractive index difference between TE and TM modes-as large as 0.8. For TM polarized modes, up to ~ 85% of the total power in the fundamental mode can be confined in the slots." @default.
• W2024723294 created "2016-06-24" @default.
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• W2024723294 date "2008-05-28" @default.
• W2024723294 modified "2023-10-18" @default.
• W2024723294 title "Birefringence and optical power confinement in horizontal multi-slot waveguides made of Si and SiO2" @default.
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• W2024723294 doi "https://doi.org/10.1364/oe.16.008623" @default.
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