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- W2024805921 abstract "An improved and efficient method to estimate quadric param- eters of imaged objects using structured light is presented. In contrast with our previous work Busboom and Schalkoff (1996) and Sorgel and Schalkoff (1997), the algorithm employs a closed-form solution and therefore iteration is unnecessary. This is possible due to the develop- ment of the line-to-curve mapping (LCM) algorithm. The algorithm relies on the fitting of a 2-D, second order curve to a passive ''stripe'' image resulting from the projection of structured light. The capabilities and shortcomings of the method are illustrated by a series of simulations and experiments. Improvements of the critical second order curve fit in the passive image are introduced and the performance of the enhanced al- gorithm is analyzed. © 1997 Society of Photo-Optical Instrumentation Engineers. (S0091-3286(97)03307-2)" @default.
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- W2024805921 date "1997-07-01" @default.
- W2024805921 modified "2023-09-26" @default.
- W2024805921 title "Direct surface parameter determination using an enhanced line-to-curve mapping approach" @default.
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- W2024805921 doi "https://doi.org/10.1117/1.601407" @default.
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