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- W2024993055 abstract "We have investigated the structural dependence of terahertz-radiation emission from the multiferroic $mathrm{Bi}mathrm{Fe}{mathrm{O}}_{3}$ thin films on ${(mathrm{La}mathrm{Al}{mathrm{O}}_{3})}_{0.3}{({mathrm{Sr}}_{2}mathrm{Al}mathrm{Ta}{mathrm{O}}_{6})}_{0.7}$ (0 0 1) substrate. The coherently strained films with thickness $(t)ensuremath{leqslant}75phantom{rule{0.3em}{0ex}}mathrm{nm}$ relax partially to bulklike rhombohedral phase at $tensuremath{geqslant}110phantom{rule{0.3em}{0ex}}mathrm{nm}$ via a coexistence of these two phases in the thickness $80phantom{rule{0.3em}{0ex}}mathrm{nm}ensuremath{leqslant}tensuremath{leqslant}110phantom{rule{0.3em}{0ex}}mathrm{nm}$. The strained films $(tensuremath{leqslant}75)$ and the relaxed films $(tensuremath{geqslant}110phantom{rule{0.3em}{0ex}}mathrm{nm})$ exhibit similar terahertz-emission efficiency in the absence of electric-field bias, and this efficiency increases for the intermediate thickness films having coexisting phases. These data combined with the electric-field $(E)$ dependence of the terahertz-emission amplitude $({E}_{mathrm{THz}})$ depict that the terahertz-emission efficiency in zero bias is nearly independent of the lattice, while the ferroelectric properties (revealed by ${E}_{mathrm{THz}}text{ensuremath{-}}E$ hysteresis loops) are characteristics of both the lattice and the leakage current." @default.
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- W2024993055 date "2008-01-14" @default.
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- W2024993055 title "Structural dependence of terahertz radiation from multiferroic<mml:math xmlns:mml=http://www.w3.org/1998/Math/MathML display=inline><mml:mrow><mml:mi mathvariant=normal>Bi</mml:mi><mml:mi mathvariant=normal>Fe</mml:mi><mml:msub><mml:mi mathvariant=normal>O</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:mrow></mml:math>thin films" @default.
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- W2024993055 doi "https://doi.org/10.1103/physrevb.77.024105" @default.
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