FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2025334554> ?p ?o ?g. }

• W2025334554 endingPage "2198" @default.
• W2025334554 startingPage "2196" @default.
• W2025334554 abstract "AlGaN/GaN high electron mobility transistors (HEMTs) with a range of gate lengths (0.8–1.2 μm) and widths (100–200 μm) were exposed to 40 MeV protons at fluences of 5×109 or 5×1010 cm−2. The drain–source currents in the devices decreased by 15%–20% at the higher fluence, while the extrinsic transconductance decreased by ∼30% under the same conditions. Based on the increases in the reverse breakdown voltage and the channel resistance, the main degradation mechanism is believed to be creation of deep trap states in the band gap which remove electrons from the channel. The maximum frequency of oscillation, fMAX, also decreased as a result of the proton-induced damage, with a change of −20% at the shorter gate widths and −50% at the largest widths. The reverse recovery switching time was essentially unaffected by the irradiation, remaining at ∼1.6×10−8 s. Postradiation annealing at 800 °C was successful in restoring the dc and rf performance parameters to ⩾90% of their original values. The AlGaN/GaN HEMTs are much more robust than their AlGaAs/GaAs counterparts to displacement damage and appear well-suited to radiation environment applications." @default.
• W2025334554 created "2016-06-24" @default.
• W2025334554 creator A5008406838 @default.
• W2025334554 creator A5008595981 @default.
• W2025334554 creator A5020967437 @default.
• W2025334554 creator A5036317154 @default.
• W2025334554 creator A5036907286 @default.
• W2025334554 creator A5037920466 @default.
• W2025334554 creator A5045725499 @default.
• W2025334554 creator A5047959812 @default.
• W2025334554 creator A5062407521 @default.
• W2025334554 creator A5075135750 @default.
• W2025334554 creator A5077738125 @default.
• W2025334554 creator A5078326554 @default.
• W2025334554 creator A5078410992 @default.
• W2025334554 creator A5085381025 @default.
• W2025334554 date "2001-10-01" @default.
• W2025334554 modified "2023-09-28" @default.
• W2025334554 title "dc and rf performance of proton-irradiated AlGaN/GaN high electron mobility transistors" @default.
• W2025334554 cites W1613908050 @default.
• W2025334554 cites W1965745149 @default.
• W2025334554 cites W1977511425 @default.
• W2025334554 cites W2014671791 @default.
• W2025334554 cites W2017635765 @default.
• W2025334554 cites W2021714295 @default.
• W2025334554 cites W2022895264 @default.
• W2025334554 cites W2038422902 @default.
• W2025334554 cites W2048951152 @default.
• W2025334554 cites W2087116976 @default.
• W2025334554 cites W2093049748 @default.
• W2025334554 cites W2098289382 @default.
• W2025334554 cites W2098755506 @default.
• W2025334554 cites W2117083572 @default.
• W2025334554 doi "https://doi.org/10.1063/1.1408606" @default.
• W2025334554 hasPublicationYear "2001" @default.
• W2025334554 type Work @default.
• W2025334554 sameAs 2025334554 @default.
• W2025334554 citedByCount "108" @default.
• W2025334554 countsByYear W20253345542012 @default.
• W2025334554 countsByYear W20253345542013 @default.
• W2025334554 countsByYear W20253345542014 @default.
• W2025334554 countsByYear W20253345542015 @default.
• W2025334554 countsByYear W20253345542016 @default.
• W2025334554 countsByYear W20253345542017 @default.
• W2025334554 countsByYear W20253345542018 @default.
• W2025334554 countsByYear W20253345542019 @default.
• W2025334554 countsByYear W20253345542020 @default.
• W2025334554 countsByYear W20253345542021 @default.
• W2025334554 countsByYear W20253345542022 @default.
• W2025334554 countsByYear W20253345542023 @default.
• W2025334554 crossrefType "journal-article" @default.
• W2025334554 hasAuthorship W2025334554A5008406838 @default.
• W2025334554 hasAuthorship W2025334554A5008595981 @default.
• W2025334554 hasAuthorship W2025334554A5020967437 @default.
• W2025334554 hasAuthorship W2025334554A5036317154 @default.
• W2025334554 hasAuthorship W2025334554A5036907286 @default.
• W2025334554 hasAuthorship W2025334554A5037920466 @default.
• W2025334554 hasAuthorship W2025334554A5045725499 @default.
• W2025334554 hasAuthorship W2025334554A5047959812 @default.
• W2025334554 hasAuthorship W2025334554A5062407521 @default.
• W2025334554 hasAuthorship W2025334554A5075135750 @default.
• W2025334554 hasAuthorship W2025334554A5077738125 @default.
• W2025334554 hasAuthorship W2025334554A5078326554 @default.
• W2025334554 hasAuthorship W2025334554A5078410992 @default.
• W2025334554 hasAuthorship W2025334554A5085381025 @default.
• W2025334554 hasConcept C106782819 @default.
• W2025334554 hasConcept C111337013 @default.
• W2025334554 hasConcept C119599485 @default.
• W2025334554 hasConcept C121332964 @default.
• W2025334554 hasConcept C127413603 @default.
• W2025334554 hasConcept C147120987 @default.
• W2025334554 hasConcept C159985019 @default.
• W2025334554 hasConcept C162057924 @default.
• W2025334554 hasConcept C165801399 @default.
• W2025334554 hasConcept C172385210 @default.
• W2025334554 hasConcept C185544564 @default.
• W2025334554 hasConcept C189278905 @default.
• W2025334554 hasConcept C192562407 @default.
• W2025334554 hasConcept C195370968 @default.
• W2025334554 hasConcept C22078206 @default.
• W2025334554 hasConcept C2777855556 @default.
• W2025334554 hasConcept C2779283907 @default.
• W2025334554 hasConcept C49040817 @default.
• W2025334554 hasConcept C54516573 @default.
• W2025334554 hasConcept C62520636 @default.
• W2025334554 hasConceptScore W2025334554C106782819 @default.
• W2025334554 hasConceptScore W2025334554C111337013 @default.
• W2025334554 hasConceptScore W2025334554C119599485 @default.
• W2025334554 hasConceptScore W2025334554C121332964 @default.
• W2025334554 hasConceptScore W2025334554C127413603 @default.
• W2025334554 hasConceptScore W2025334554C147120987 @default.
• W2025334554 hasConceptScore W2025334554C159985019 @default.
• W2025334554 hasConceptScore W2025334554C162057924 @default.
• W2025334554 hasConceptScore W2025334554C165801399 @default.
• W2025334554 hasConceptScore W2025334554C172385210 @default.
• W2025334554 hasConceptScore W2025334554C185544564 @default.
• W2025334554 hasConceptScore W2025334554C189278905 @default.
• W2025334554 hasConceptScore W2025334554C192562407 @default.

• next