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• W2025698757 abstract "Second-harmonic microscopy is a fast, interface specific, remote sensing technique for the quantitative in situ investigation of a large number of real interfaces. The second-order optical susceptibility of the individual domains at an interface can be measured and interpreted molecularly. The benefits of stigmatic instead of serial imaging are discussed. A novel experimental geometry is described which allows the construction of a sum frequency microscope. Sum frequency imaging provides interface specific, chemically and conformationally resolved infrared information with the spatial resolution limit of a visible light microscope." @default.
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• W2025698757 date "1999-05-01" @default.
• W2025698757 modified "2023-10-18" @default.
• W2025698757 title "Second-Harmonic Microscopy — New Tool for the Remote Sensing of Interfaces" @default.
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• W2025698757 doi "https://doi.org/10.1002/(sici)1521-396x(199905)173:1<15::aid-pssa15>3.0.co;2-8" @default.
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