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• W2026006048 abstract "An analysis of charge pump design for improved radiation tolerance of phase locked loops is presented. Two radiation-hardened-by-design approaches are considered to mitigate the total ionizing dose damage of the circuit, and a thick-film SOI SiGe process technology has been used to reduce charge collection of single event strikes. The results show that a modified design approach to implement the charge pump using SiGe HBTs can provide advantages in radiation tolerance to improve tri-state leakage performance, particularly for missions expecting large accumulated doses." @default.
• W2026006048 created "2016-06-24" @default.
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• W2026006048 date "2011-12-01" @default.
• W2026006048 modified "2023-09-26" @default.
• W2026006048 title "A Study of Total Dose Mitigation Approaches for Charge Pumps in Phase-Locked Loop Applications" @default.
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• W2026006048 doi "https://doi.org/10.1109/tns.2011.2170200" @default.
• W2026006048 hasPublicationYear "2011" @default.
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