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• W2026328359 abstract "This article highlights the problems associated with interpreting data on the resistivity of thin films. It is pointed out that extreme care must be taken in analysing data and a thorough study should be made of the morphology of the films from which data are taken. Without this, values deduced for parameters such as the surface roughness, the specularity and in particular the product of the bulk resistivity and the bulk mean free path are worthless. Even when the scattering contributions from the surface and the grain boundaries are taken properly into account, because of the high defect and dislocation densities in many of the films studied the values deduced for these parameters are still in doubt." @default.
• W2026328359 created "2016-06-24" @default.
• W2026328359 creator A5065866812 @default.
• W2026328359 date "1983-08-01" @default.
• W2026328359 modified "2023-10-07" @default.
• W2026328359 title "The resistivity of thin metal films—Some critical remarks" @default.
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• W2026328359 doi "https://doi.org/10.1016/0040-6090(83)90344-9" @default.
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