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• W2026352326 abstract "AbstractAn automatic interference pattern processor has been developed for the purpose of rapidlyand accurately evaluating either real time interference patterns or interferograms. Thesystem has been designed to provide quick and easily interpretable feedback so that theoperator can monitor the system's measurements. The system includes: (1) a semi -automaticmode to facilitate the measurement of difficult interference patterns and (2) an integral,easily used calibration mode. The results of the least squares evaluation are availablein a variety of formats.IntroductionInterferometry has long been used in optical metrology. The advent of the laser has madeits use widespread not only among optical component and system fabricators but also amongthe users of optical components and systems.For most interferometry the output of the measurement is an interference fringe patternwhich can be observed in real time and photographed to produce an interferogram.. The typeof pattern is determined by the particular measurement configuration and by the errors inthe article under test. The quantitative evaluation of an interference fringe pattern isusually based on ascertaining the fractional deviation of the interference fringe patternfrom some ideal, best - fitting pattern. The denominator of the fractional deviation is themeasured spacing between a pair of fringes in the ideal pattern.The quantitative usefulness of an interference pattern is dependent upon having a methodof data extraction and evaluation. Interference pattern evaluation can range in complexityfrom a simple, subjective visual evaluation to an elaborate evaluation of the data extractedby an automatic microdensitometer with a large computer.1,2,3 In between these extremesthere are a great variety of means for hand evaluation.Unfortunately, the aforementioned techniques are either (1) subjective and, therefore, ofdubious accuracy, (2) extremely tedious and time consuming, or (3) require access to an ex-pensive, sophisticated facility. Therefore, for most users of interferometry, the diffi-culty in evaluating the output interference pattern has been a serious obstacle not only toits broader use but also to the achievement of its inherent accuracy and precision.This paper describes a new electronic instrument, an automatic pattern processor, whichhas been designed specifically to evaluate an interference pattern which has been trans -duced by a low geometric distortion CCTV camera. The system performs a least squares fitto an array of points located on the center of the fringes. The coordinates of the arrayof points located on the fringe centers are obtained either automatically or manually. Thesystem is essentially a video fringe center coordinate digitizer with the numerical computa-tion capability to do rapid, sophisticated analysis of the data. The system is an attemptto make available to most users of interferometry, an objective, powerful, and essentiallyreal -time interference pattern evaluation capability available previously only at a fewfacilities.Technical ConsiderationsGeneralThe fringes in an interference pattern represent contour levels of optical path dif-ference (OPD) between a reference wavefront and a measurement wavefront which has inter-acted with the article or system under test. The positions of the centers of these fringesare the basic raw data for evaluation of the interference pattern.For a numerical evaluation of the interference pattern, it is desirable to have as uni-form as practical a sampling of the interference pattern over the clear aperture (pupil).This is best achieved by using straight -line bias fringes. It is useful to use well-definedpatterns without closed fringes in order to eliminate ambiguity in numbering the fringes,i.e., assigning order numbers. Phase information is ascertained by specifying the locationof the zero order. This can be done either manually or automatically." @default.
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• W2026352326 title "<title>An Automatic Interference Pattern Processor With Interactive Capability</title>" @default.
• W2026352326 doi "https://doi.org/10.1117/12.938230" @default.
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