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• W2026894527 abstract "A transient capacitance - voltage (TCV) method is proposed for measuring the net donor concentration, the free electron concentration and the space charge distribution of Schottky diodes prepared on Si-doped AlGaAs. The utility of this method is demonstrated by determining the binding energy of the DX centre from the temperature-dependent free electron concentration. Comparisons of the space charge distribution between theory and experiment are performed for the positive-U and negative-U model of the DX centres. The results obtained for the negative-U model are consistent with recent observations of multi-DX levels." @default.
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• W2026894527 title "A transient capacitance - voltage method for characterizing DX centres" @default.
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• W2026894527 doi "https://doi.org/10.1088/0268-1242/11/12/004" @default.
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