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• W2027328100 abstract "Complete mechanical measurements are performed in submicron films using the picosecond ultrasonic technique. The Al layer deposited on the top of the sample acting as a transducer is replaced with a nanostructured Al film. Using an usual picosecond ultrasonic setup we can excite and detect high-frequency longitudinal and surface acoustic waves. From this we can deduce Young’s modulus and Poisson’s ratio of any isotropic thin film. Experimental results obtained for a thin silica layer on silicon are in very good agreement with literature." @default.
• W2027328100 created "2016-06-24" @default.
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• W2027328100 date "2008-08-18" @default.
• W2027328100 modified "2023-09-25" @default.
• W2027328100 title "Complete thin film mechanical characterization using picosecond ultrasonics and nanostructured transducers: experimental demonstration on SiO2" @default.
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• W2027328100 doi "https://doi.org/10.1063/1.2975171" @default.
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