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• W2027705117 abstract "The impact of semiconductor/oxide interface traps (ITs) on the turn-on characteristics of tunnel field-effect transistors (TFETs) is carefully investigated through TCAD. IT density is treated as a 2-D continuum. Both a conventional and an advanced nanowire TFET, designed to fulfill ITRS specs, are addressed. Surprisingly, in conventional TFETs, high concentrations of acceptor-like ITs can suppress device ambipolarity, thus reducing transistor's OFF-state current." @default.
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• W2027705117 date "2013-12-01" @default.
• W2027705117 modified "2023-09-29" @default.
• W2027705117 title "Can Interface Traps Suppress TFET Ambipolarity?" @default.
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• W2027705117 doi "https://doi.org/10.1109/led.2013.2284290" @default.
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