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• W2027759311 abstract "In this paper, the formation and evolution of defects induced by ion irradiation with 1MeV Si+ ions in Ni2Si∕4H–SiC Schottky diodes were studied and correlated with the electrical properties of the contacts. The current-voltage characteristics of the contacts monitored before and after irradiation showed an increase of the Schottky barrier height, of the series resistance, and of the leakage current with increasing irradiation fluence. The changes in the barrier height and in the series resistance values could be attributed to the dopant deactivation in the near-interface region, while the increase of the leakage current was associated with the formation of irradiation-induced defects. These defects showed an evolution with increasing irradiation fluence. Moreover, a combination of deep-level transient spectroscopy and current-voltage measurements of the diodes allowed us to demonstrate that the Z1∕Z2 center of 4H–SiC has the major influence on the increase of the diodes leakage current in the irradiated material." @default.
• W2027759311 created "2016-06-24" @default.
• W2027759311 creator A5003937299 @default.
• W2027759311 creator A5004595594 @default.
• W2027759311 creator A5044804329 @default.
• W2027759311 creator A5045725750 @default.
• W2027759311 creator A5069135661 @default.
• W2027759311 creator A5075349972 @default.
• W2027759311 date "2006-01-01" @default.
• W2027759311 modified "2023-10-03" @default.
• W2027759311 title "Defects and electrical behavior in 1MeV Si+-ion-irradiated 4H–SiC Schottky diodes" @default.
• W2027759311 cites W1971079973 @default.
• W2027759311 cites W1971533411 @default.
• W2027759311 cites W1983587746 @default.
• W2027759311 cites W1986953797 @default.
• W2027759311 cites W1999840001 @default.
• W2027759311 cites W2003762416 @default.
• W2027759311 cites W2012904318 @default.
• W2027759311 cites W2017054571 @default.
• W2027759311 cites W2022060531 @default.
• W2027759311 cites W2028667417 @default.
• W2027759311 cites W2028833392 @default.
• W2027759311 cites W2034098238 @default.
• W2027759311 cites W2053444481 @default.
• W2027759311 cites W2056882812 @default.
• W2027759311 cites W2067547687 @default.
• W2027759311 cites W2067911605 @default.
• W2027759311 cites W2079620942 @default.
• W2027759311 cites W2083156957 @default.
• W2027759311 cites W2087588623 @default.
• W2027759311 cites W2087650731 @default.
• W2027759311 cites W2108461002 @default.
• W2027759311 cites W2138031607 @default.
• W2027759311 cites W2145757162 @default.
• W2027759311 cites W2164775618 @default.
• W2027759311 doi "https://doi.org/10.1063/1.2158501" @default.
• W2027759311 hasPublicationYear "2006" @default.
• W2027759311 type Work @default.
• W2027759311 sameAs 2027759311 @default.
• W2027759311 citedByCount "31" @default.
• W2027759311 countsByYear W20277593112012 @default.
• W2027759311 countsByYear W20277593112013 @default.
• W2027759311 countsByYear W20277593112015 @default.
• W2027759311 countsByYear W20277593112016 @default.
• W2027759311 countsByYear W20277593112018 @default.
• W2027759311 countsByYear W20277593112019 @default.
• W2027759311 countsByYear W20277593112021 @default.
• W2027759311 countsByYear W20277593112023 @default.
• W2027759311 crossrefType "journal-article" @default.
• W2027759311 hasAuthorship W2027759311A5003937299 @default.
• W2027759311 hasAuthorship W2027759311A5004595594 @default.
• W2027759311 hasAuthorship W2027759311A5044804329 @default.
• W2027759311 hasAuthorship W2027759311A5045725750 @default.
• W2027759311 hasAuthorship W2027759311A5069135661 @default.
• W2027759311 hasAuthorship W2027759311A5075349972 @default.
• W2027759311 hasConcept C111337013 @default.
• W2027759311 hasConcept C119599485 @default.
• W2027759311 hasConcept C121332964 @default.
• W2027759311 hasConcept C127413603 @default.
• W2027759311 hasConcept C139719470 @default.
• W2027759311 hasConcept C14485415 @default.
• W2027759311 hasConcept C145148216 @default.
• W2027759311 hasConcept C159985019 @default.
• W2027759311 hasConcept C16115445 @default.
• W2027759311 hasConcept C162324750 @default.
• W2027759311 hasConcept C165801399 @default.
• W2027759311 hasConcept C178790620 @default.
• W2027759311 hasConcept C185544564 @default.
• W2027759311 hasConcept C185592680 @default.
• W2027759311 hasConcept C191952053 @default.
• W2027759311 hasConcept C192562407 @default.
• W2027759311 hasConcept C205200001 @default.
• W2027759311 hasConcept C20615193 @default.
• W2027759311 hasConcept C22078206 @default.
• W2027759311 hasConcept C2777042071 @default.
• W2027759311 hasConcept C2780080961 @default.
• W2027759311 hasConcept C2780722187 @default.
• W2027759311 hasConcept C49040817 @default.
• W2027759311 hasConcept C544956773 @default.
• W2027759311 hasConcept C57863236 @default.
• W2027759311 hasConcept C78434282 @default.
• W2027759311 hasConceptScore W2027759311C111337013 @default.
• W2027759311 hasConceptScore W2027759311C119599485 @default.
• W2027759311 hasConceptScore W2027759311C121332964 @default.
• W2027759311 hasConceptScore W2027759311C127413603 @default.
• W2027759311 hasConceptScore W2027759311C139719470 @default.
• W2027759311 hasConceptScore W2027759311C14485415 @default.
• W2027759311 hasConceptScore W2027759311C145148216 @default.
• W2027759311 hasConceptScore W2027759311C159985019 @default.
• W2027759311 hasConceptScore W2027759311C16115445 @default.
• W2027759311 hasConceptScore W2027759311C162324750 @default.
• W2027759311 hasConceptScore W2027759311C165801399 @default.
• W2027759311 hasConceptScore W2027759311C178790620 @default.
• W2027759311 hasConceptScore W2027759311C185544564 @default.
• W2027759311 hasConceptScore W2027759311C185592680 @default.
• W2027759311 hasConceptScore W2027759311C191952053 @default.
• W2027759311 hasConceptScore W2027759311C192562407 @default.
• W2027759311 hasConceptScore W2027759311C205200001 @default.
• W2027759311 hasConceptScore W2027759311C20615193 @default.
• W2027759311 hasConceptScore W2027759311C22078206 @default.

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