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- W2028551314 abstract "A relaxation model for oscillations observed in deep-trap-doped pin structures under double-carrier injection is proposed. It appears that, when a critical voltage is reached, the cross-over zone (n0 = p0) of region i becomes unstable and initiates the propagation of damped waves toward the contacts, the decay time of which determines the frequency. Nous proposons un modéle de relaxation pour expliquer les oscillations observées dans les structures pin, dopées de centres recombinants profonds, en régime de double injection. Nous montrons que lorsque un potentiel critique est appliqué, la «zone de croisement» (définie par n0 = p0) de la région centrale devient instable et est la source d'ondes amorties qui se propagent vers les extrémités. Le temps d'amortissement de ces ondes détermine en général la fréquence des oscillations." @default.
- W2028551314 created "2016-06-24" @default.
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- W2028551314 date "1971-05-16" @default.
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- W2028551314 title "A relaxation model for oscillations in semiconductors with double-carrier injection" @default.
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- W2028551314 doi "https://doi.org/10.1002/pssa.2210050221" @default.
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