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- W2028967522 abstract "We report for the first time the use of a glancing angle (12° − 2°) X-ray diffraction technique for the study of subsurface damage in metals. We have investigated radiation damage caused by low energy helium ions in nickel. The damage confined only to the near surface region, typically a few thousand angstroms, consists of displacement type damage and implanted species. As the X-ray penetration depth (for 99% absorption) can be continuously varied as a function of angle of incidence and X-ray wavelength, accurate lattice parameter measurements (back-reflection) can be used to obtain cumulative information regarding long and short-range strain field of defects. High purity nickel foils (3 mm diameter, 1 mm thick) were irradiated at room temperature with 100 keV helium ions to fluence levels of 1017–1018Hecm2. In nickel, the projected range of these ions is about 0.25 μm. CrKα and CuKα X-rays incident at 1° shall respectively probe 0.6 μm and 2.0 μm depths. The results show (a) for dose levels upto 5 × 1017Hecm2, a rather large decrease in lattice parameter (0.006–0.015 Å) as observed with CrKα With CuKα, strain fields ranging from −0.015 Å to +0.035 Å were observed indicating the presence of two different defect species of opposite nature in the specimen and (b) for higher doses, lattice expansion (0.004–0.015 Å) as observed both with CrKα and CuKα. However a structural transformation, indicated by the appearance of a new line (d = 1.253Å) was observed with CrKα. As only a limited region of reciprocal space can be explored with the present setup, detailed investigations of the phase transformation are being carried out using transmission electron microscopy." @default.
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- W2028967522 date "1986-04-01" @default.
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- W2028967522 title "Glancing angle X-ray diffraction investigations of subsurface damage in he-irradiated nickel" @default.
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- W2028967522 doi "https://doi.org/10.1016/0168-583x(86)90405-2" @default.
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