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- W2029177325 abstract "Interdiffusion between sputter-deposited thin Y-Ba-Cu-O films and Al2O3 substrates has been studied by applying 3.2 MeV 4He+ Rutherford backscattering spectrometry. The effects of morphology variation of the films during annealing have been successfully excluded using the data of thickness distribution measured by applying atomic force microscopy. The formalism used for the analysis is presented. The obtained values of the diffusivities are more than 20 times smaller than those reported by other workers." @default.
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- W2029177325 date "1994-11-15" @default.
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- W2029177325 title "Interdiffusion between Y-Ba-Cu-O thin films and Al2O3 substrates studied by applying Rutherford backscattering spectrometry combined with atomic force microscopy" @default.
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- W2029177325 doi "https://doi.org/10.1063/1.358407" @default.
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