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- W2029494795 abstract "Amorphous alloys can be produced as the outcome of diffusion reaction between evaporated thin crystalline films. The Cu–Ho system is a favorable one for such a reaction to occur. The amorphization and the recrystallization of Cu–Ho multilayers has been previously observed using transmission electron microscopy. In the present study the various stages of the interdiffusion processes in this multilayer system were investigated by means of electron spectroscopy techniques. Auger electron spectroscopy depth profiling showed the evolution of the mixing process from the multilayer structure to its completion. The mixing process was accompanied by a shift without broadening of the x-ray photoelectron spectroscopy Ho 4d line. This shift is attributed to a charge transfer from the Ho ion. The lack of line broadening indicated that the mixing was completed down to the atomic level." @default.
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- W2029494795 date "1987-07-01" @default.
- W2029494795 modified "2023-09-26" @default.
- W2029494795 title "Structural and electronic effects of the solid‐state amorphization and recrystallization of Cu–Ho thin films" @default.
- W2029494795 doi "https://doi.org/10.1116/1.574519" @default.
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