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• W2029596382 abstract "New developments in nanoscience and nanotechnology require nanometer scale resolution imaging tools and techniques such as an extreme ultraviolet (EUV) and soft X-ray (SXR) microscopy, based on Fresnel zone plates. In this paper, we report on applications of a desk-top microscopy using a laser-plasma EUV source based on a gas-puff target for studies of morphology of thin silicon membranes coated with NaCl crystals and samples composed of ZnO nanofibers." @default.
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• W2029596382 date "2013-12-01" @default.
• W2029596382 modified "2023-10-17" @default.
• W2029596382 title "Study of crystalline thin films and nanofibers by means of the laser–plasma EUV-source based microscopy" @default.
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• W2029596382 doi "https://doi.org/10.1016/j.radphyschem.2013.02.019" @default.
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