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• W2029891191 endingPage "51" @default.
• W2029891191 startingPage "40" @default.
• W2029891191 abstract "• Expressions have been established for the time dependence of the secondary electron emission yield of insulators submitted to X-ray irradiations. • Illustrated for two different samples the present analytical expressions may be transposed easily to a wide variety of other sample compositions. • For minimizing charging effects, the efficiency of using a flood gun has been investigated with a special attention to the reflectivity of incident electrons. • The mechanism and role of leakage resulting from the injection of electrons from the sample holder are detailed. • Concerning mainly X-ray irradiations of insulators in XPS and in XPEEM the corresponding results may also be adapted other types projectiles contributing to a positive charging. Some aspects of the time dependence of positive charging of insulating films are evaluated when they are set on conductive substrates and are exposed to X-rays. This evaluation is based on the influence of the electrostatic surface potential due to the positive charges left by the effective secondary electron emission into the vacuum, δ x , combined with some work function effects. Valid up to a surface potential of ∼3–5 V, an expression for the nearly exponential decay of δ x , time constant τ , is established as a function of the fluence of the irradiation and the geometry and characteristic of the sample and of its environment. The results being a function of the spectral and angular distributions of the emitted SEs, the order of magnitude of the corresponding factors are evaluated numerically for two extreme situations, that of inorganic insulators and that of floating conductors in order to be extended easily to other types of materials. The decay may be preceded by a dwell time, τ s , particularly when an external collector is negatively biased. When flood guns are used, the work function effects limit the efficiency of the neutralization effects by the increasing reflection coefficient of the very low energy incident electrons. Finally, the mechanism of the degradation effects of electrons that are issued from the sample holder/sample interface is also developed. This approach may also be adapted other projectiles such as UV photons, ions or electrons." @default.
• W2029891191 created "2016-06-24" @default.
• W2029891191 creator A5068894623 @default.
• W2029891191 date "2014-01-01" @default.
• W2029891191 modified "2023-09-25" @default.
• W2029891191 title "Work function effects on the positive charging of supported insulating samples exposed to X-rays (as in XPS) and other irradiations" @default.
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• W2029891191 doi "https://doi.org/10.1016/j.elspec.2014.01.009" @default.
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