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• W2031377764 abstract "Various thin films of germanium silicate glass with high germania content have been fabricated by a sol-gel method. After densification, these films have a high optical quality and can be used as planar waveguides. The densification behavior of these films was studied by measurements of the index of refraction, as a function of heat treatment temperatures, using ellipsometry. The relationship of refractive index versus GeO2 content follows the additive Lorentz-Lorenz model. Waveguiding Raman spectroscopy suggested the formation of SiOGe linkages in these films without phase segregation. Various waveguide propagation characteristics, at 632.8 nm, were studied using a prism coupling technique. The propagation loss rate of a 50GeO250SiO2 glass waveguide was measured as 3.31 dB/cm." @default.
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• W2031377764 date "1994-11-01" @default.
• W2031377764 modified "2023-09-25" @default.
• W2031377764 title "GeO2SiO2 thin films for planar waveguide applications" @default.
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• W2031377764 doi "https://doi.org/10.1016/0022-3093(94)90277-1" @default.
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