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- W2032921468 abstract "X-ray photoelectron spectroscopy (XPS) is used to characterize the surfaces of epitaxial c-axis oriented Tl2Ba2CaCu2 O8+x (TBCCO) thin films which have been chemically etched in a solution of Br2 in absolute ethanol. Comparison of the XPS core level spectra presented here with spectra in the literature obtained from single crystals cleaved in vacuum or polycrystalline pellets fractured or scraped in vacuum shows that the chemically etched thin films exhibit lower levels of nonsuperconducting surface species. Cation disorder is found to be restricted to the Ba sites. XPS valence band spectra show a clear Fermi edge, indicating that the room temperature conductivity near the surface is metallic. To the authors' knowledge, this is the first report of a clear Fermi edge detected on TBCCO. Exposure of the chemically etched films to air results in a significant surface degradation even for exposure times as short as 1 min." @default.
- W2032921468 created "2016-06-24" @default.
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- W2032921468 date "1991-06-01" @default.
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- W2032921468 title "X-ray photoelectron spectroscopy study of chemically etched Tl2Ba2CaCu2O8+x thin film surfaces" @default.
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- W2032921468 doi "https://doi.org/10.1016/0921-4534(91)90321-o" @default.
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