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• W2032996886 abstract "Nickel oxide films were synthesized by electrochemical precipitation of Ni(OH)2 followed by heat-treatment in air at various temperatures (200–600 °C). Their structure and electrochemical properties were studied by cyclic voltammetry, X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS). XRD results showed that the nickel oxide obtained at 250 °C or above has a crystalline NiO structure. The specific capacitance of the oxide depends on the heat-treatment temperature, showing a maximum value at 300 °C. XAS results revealed that the non-stoichiometric nickel oxide (Ni1−xO) approached the stoichiometric NiO structure with increasing heat-treatment temperature due to the defect healing effect. The defective nature of the nickel oxide could be utilized to improve its specific capacitance for supercapacitor application." @default.
• W2032996886 created "2016-06-24" @default.
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• W2032996886 date "2002-07-01" @default.
• W2032996886 modified "2023-10-14" @default.
• W2032996886 title "X-ray absorption spectroscopy studies of nickel oxide thin film electrodes for supercapacitors" @default.
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• W2032996886 doi "https://doi.org/10.1016/s0013-4686(02)00240-2" @default.
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