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• W2033589075 endingPage "1008" @default.
• W2033589075 startingPage "1000" @default.
• W2033589075 abstract "By technology down scaling in nowadays digital circuits, their sensitivity to radiation effects increases, making the occurrence of soft errors more probable. As a consequence, soft error rate estimation of complex circuits such as processors is becoming an important issue in safety- and mission-critical applications. Fault injection is a well-known and widely used approach for soft error rate estimation. Development of previous FPGA-based fault injection techniques is very time consuming mainly because they do not adequately exploit supplementary FPGA tools. This paper proposes an easy-to-develop and flexible FPGA-based fault injection technique. This technique utilizes debugging facilities of Altera FPGAs in order to inject single event upset (SEU) and multiple bit upset (MBU) fault models in both flip-flops and memory units. As this technique uses FPGA built-in facilities, it imposes negligible performance and area overheads on the system. The experimental results show that the proposed technique is on average four orders of magnitude faster than a pure simulation-based fault injection. These features make the proposed technique applicable to industrial-scale circuits." @default.
• W2033589075 created "2016-06-24" @default.
• W2033589075 creator A5005928293 @default.
• W2033589075 creator A5052391185 @default.
• W2033589075 creator A5060172441 @default.
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• W2033589075 date "2014-05-01" @default.
• W2033589075 modified "2023-10-05" @default.
• W2033589075 title "A fast, flexible, and easy-to-develop FPGA-based fault injection technique" @default.
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• W2033589075 doi "https://doi.org/10.1016/j.microrel.2014.01.002" @default.
• W2033589075 hasPublicationYear "2014" @default.
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